Atomic Force Microscope (AFM)
Product Detail
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Test Service |
Atomic Force Microscope (AFM) |
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Instrument Model |
NT-MDT Prima, Bruker Dimension Edge, Bruker Dimension ICON, Agilent 5500 |
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Test Content |
Morphology, PFM, EFM, KPFM, MFMC-AFM/PeakForce TUNA |
|
Sample Type |
Powder/Film/Bulk |
Notes:
1. Sample requirements:
(1) For film/bulk sample:
- Length/Width: 0.5-3 cm; Thickness: 0.1-1 cm;
- Surface Roughness: < 5 μm
- Please mark the test surface.
(2) For powder series sample:
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Type of Powder series |
Required Weight Per Sample |
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Powder |
≥ 20 mg, particle size < 5 μm |
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Powder in solvent |
≥ 1 mL |
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Powder prepared on silicon slice |
Length/Width: 0.5-3 cm |
2. Powder sample preparation instructions: The powder is dispersed in XX solvent (usually ethanol or deionized water) and dropped onto the mica sheet/silicon slice for drying.
3. Please download and print the order form and send it with the sample after the order is completed.
4. All samples are non-returnable and please contact us if you have special requests.
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